| Title:
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ASIAN TEST SYMPOSIUM PROCEEDINGS
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| Volume: |
6th 1997 |
| By: |
Institute of Electrical and Electronics Engineers |
| Format: |
Paperback |
| List price:
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£117.50 |
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| ISBN 10: |
0818682094 |
| ISBN 13: |
9780818682094 |
| Publisher: |
IEEE COMPUTER SOCIETY PRESS,U.S. |
| Pub. date: |
31 January, 1998 |
| Pages: |
400 |
| Description: |
Areas covered in this text include: test generation; design for testability; fault tolerance; case studies for DFT techniques in Japanese industry; test technologies; beam testing of VLSI circuits in Japan; mixed-signal test; novel beam testing techniques in Japan; and current testing. |
| Synopsis: |
Areas covered in this text include: test generation; design for testability; fault tolerance; case studies for DFT techniques in Japanese industry; test technologies; beam testing of VLSI circuits in Japan; mixed-signal test; novel beam testing techniques in Japan; and current testing." |
| Publication: |
US |
| Imprint: |
IEEE Computer Society Press,U.S. |
| Returns: |
Non-returnable |