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Item Details
Title: AN INTRODUCTION TO LOGIC CIRCUIT TESTING
By: Parag Lala, Mitchell A. Thornton
Format: Paperback

List price: £35.95


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 1598293508
ISBN 13: 9781598293500
Publisher: MORGAN & CLAYPOOL PUBLISHERS
Pub. date: 15 August, 2008
Series: Synthesis Lectures on Digital Circuits and Systems
Pages: 100
Synopsis: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.
Illustrations: black & white illustrations
Publication: US
Imprint: Morgan & Claypool Publishers
Returns: Non-returnable
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