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Item Details
Title: SCANNING MICROSCOPIES
16-18 SEPTEMBER 2014, MONTEREY, CALIFORNIA, UNITED STATES
Volume: 2014
By: Michael T. Postek (Editor), Dale Newbury (Editor), S. Frank Platek (Editor)
Format: Paperback

List price: £110.00


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 1628412992
ISBN 13: 9781628412994
Publisher: SPIE PRESS
Pub. date: 30 December, 2014
Series: Proceedings of SPIE
Pages: 277
Description: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Synopsis: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Publication: US
Imprint: SPIE Press
Returns: Returnable
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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING II (PB)
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING IV
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS V (PB)
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VI (PB)
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VII (PB)
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VII (PB)
NEW RESEARCH IN NANOTECHNOLOGY (HB)
SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS (HB)
SCANNING MICROSCOPIE (PB)
SCANNING MICROSCOPIES (PB)
SCANNING MICROSCOPIES 2011 (PB)
SCANNING MICROSCOPIES 2012 (PB)
SCANNING MICROSCOPY 2010 (PB)
X-RAY SPECTROMETRY IN ELECTRON BEAM INSTRUMENTS (HB)

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