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Item Details
| Title:
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MECHANICAL STRESS ON THE NANOSCALE
SIMULATION, MATERIAL SYSTEMS AND CHARACTERIZATION TECHNIQUES |
| By: |
Margrit Hanbucken (Editor), Pierre Muller (Editor), Ralf B. Wehrspohn (Editor) |
| Format: |
Hardback |
| List price:
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£139.95 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
352741066X |
| ISBN 13: |
9783527410668 |
| Publisher: |
WILEY-VCH VERLAG GMBH |
| Pub. date: |
2 November, 2011 |
| Pages: |
380 |
| Description: |
* The ability to measure stress or strain in semiconductor devices has impact on the design of novel devices. * Currently, there is no comprehensive overview of the recently developed nanostress techniques. * There are a number of books related to the different experimental techniques. |
| Synopsis: |
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics. |
| Illustrations: |
Illustrations (some col.) |
| Publication: |
Germany |
| Imprint: |
Wiley-VCH Verlag GmbH |
| Returns: |
Returnable |
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