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Modeling of Electrical Overstress in Integrated Circuits(Hardback)
Springer
Published:
03/11/1994
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose as one of the threats to integrated circuits (ICs). This book analyzes the EOS/ESD-related failures in I/O protection devices in in...
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Modeling of Electrical Overstress in Integrated Circuits(Paperback)
Springer-Verlag New York Inc.
Published:
27/09/2012
Fundamental understanding of the physical phenomena leading to device failures under ESD/EOS events is needed for the development of device models and CAD tools that can efficiently describe the d...
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