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Item Details
| Title:
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MICROWAVE ELECTRONICS
MEASUREMENT AND MATERIALS CHARACTERIZATION |
| By: |
L. F. Chen, C. K. Ong, C. P. Neo |
| Format: |
Electronic book text |
| List price:
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£171.60 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
0470299266 |
| ISBN 13: |
9780470299265 |
| Publisher: |
JOHN WILEY & SONS INC |
| Pub. date: |
10 December, 2007 |
| Pages: |
552 |
| Publication: |
US |
| Imprint: |
John Wiley & Sons Inc |
| Returns: |
Non-returnable |
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