 |
|
|
Item Details
| Title:
|
TEST STRUCTURE, MODELING AND CHARACTERIZATION OF CMOS-BASED RF DEVICES
|
| By: |
Juin J. Liou |
| Format: |
Hardback |
| List price:
|
£56.95 |
|
We currently do not stock this item, please contact the publisher directly for
further information.
|
|
|
|
|
|
| ISBN 10: |
0471469653 |
| ISBN 13: |
9780471469650 |
| Publisher: |
JOHN WILEY AND SONS LTD |
| Pub. date: |
17 February, 2004 |
| Pages: |
320 |
| Description: |
Due to the explosive growth in the worldwide internet economy, many researchers and engineers are now engaged in the design and manufacturing of RF electronics. This book provides readers with an authoritative, highly practical resource they can use in the design, modeling, and characterization of CMOS-based RF semiconductor devices. |
| Returns: |
Returnable |
|
|
|
 |
|
|
|
|
|
No Cheese, Please!
A fun picture book for children with food allergies - full of friendship and super-cute characters!Little Mo the mouse is having a birthday party.
|
My Brother Is a Superhero
Luke is massively annoyed about this, but when Zack is kidnapped by his arch-nemesis, Luke and his friends have only five days to find him and save the world...
|
|
|
|
|