| Title:
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STATISTICAL METROLOGY
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| Volume: |
3rd International Workshop 1998 |
| By: |
IEEE Electron Devices Society |
| Format: |
Paperback |
| List price:
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£99.50 |
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| ISBN 10: |
0780343387 |
| ISBN 13: |
9780780343382 |
| Publisher: |
I.E.E.E.PRESS |
| Pub. date: |
31 July, 1998 |
| Pages: |
130 |
| Description: |
This workshop focused on issues such as the generalization and utilization of statistically significant measurements to characterise and validate VLSI processes, designs and equipment operations. Papers discuss areas including yield ramping methodology in pre-produciton phase. |
| Synopsis: |
This workshop focused on issues such as the generalization and utilization of statistically significant measurements to characterise and validate VLSI processes, designs and equipment operations. Papers discuss areas including yield ramping methodology in pre-produciton phase. |
| Publication: |
US |
| Imprint: |
I.E.E.E.Press |
| Returns: |
Non-returnable |