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Item Details
Title:
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ISTFA 2002
PROCEEDINGS OF THE 28TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 3-7 NOVEMBER 2002, PHOENIX, ARIZONA |
By: |
ASM International (Creator), ASM |
Format: |
Paperback |

List price:
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£124.00 |
We currently do not stock this item, please contact the publisher directly for
further information.
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ISBN 10: |
0871707713 |
ISBN 13: |
9780871707710 |
Publisher: |
ASM INTERNATIONAL |
Pages: |
750 |
Description: |
This proceedings from the November 2002 conference on the analysis of microelectronic device and system failures reflects the current unpredictability of economics and of the next generation of electronic mass products. The 102 papers explore metrology, materials, optical probing, system level analysis, and the failure analysis process. Topics incl |
Synopsis: |
Proceedings of the 28th International Symposium for Testing and Failure Analysis, 3-7 November 2002, Phoenix, Arizona. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents: Advanced Microelectronic Failure Analysis Techniques Metrology and Materials Analysis Package Level Analysis Microelectromechanical Systems Sample Preparation Failure Analysis Processes System Level Analysis Die Level Fault Isolation Discretes/Passives Scanning Probe Microscopy Techniques Test Analysis Optical Probing Yield Enhancement. (+ VAT) |
Publication: |
US |
Imprint: |
ASM International |
Returns: |
Non-returnable |
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