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Item Details
| Title:
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CHARACTERISATION OF RADIATION DAMAGE BY TRANSMISSION ELECTRON MICROSCOPY
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| By: |
M. L. Jenkins, M. A. Kirk |
| Format: |
Electronic book text |
| List price:
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£133.20 |
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We believe that this item is permanently unavailable, and so we cannot source
it.
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| ISBN 10: |
1420034642 |
| ISBN 13: |
9781420034646 |
| Publisher: |
TAYLOR & FRANCIS INC |
| Pub. date: |
21 November, 2000 |
| Series: |
Series in Microscopy in Materials Science |
| Pages: |
224 |
| Synopsis: |
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. |
| Publication: |
US |
| Imprint: |
CRC Press Inc |
| Returns: |
Non-returnable |
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Ramadan and Eid al-Fitr
A celebratory, inclusive and educational exploration of Ramadan and Eid al-Fitr for both children that celebrate and children who want to understand and appreciate their peers who do.
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