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Item Details
| Title:
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RF AND MICROWAVE MODELING AND MEASUREMENT TECHNIQUES FOR FIELD EFFECT TRANSISTORS
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| By: |
Jianjun Gao |
| Format: |
Hardback |
| List price:
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£83.00 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
1891121898 |
| ISBN 13: |
9781891121890 |
| Publisher: |
SCITECH PUBLISHING INC |
| Pub. date: |
15 February, 2010 |
| Series: |
Electromagnetics and Radar |
| Pages: |
350 |
| Synopsis: |
This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based. This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. |
| Publication: |
US |
| Imprint: |
SciTech Publishing Inc |
| Returns: |
Returnable |
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