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Item Details
| Title:
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ELECTROTHERMAL ANALYSIS OF VLSI SYSTEMS
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| By: |
Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng |
| Format: |
Hardback |
| List price:
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£119.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
079237861X |
| ISBN 13: |
9780792378617 |
| Publisher: |
SPRINGER |
| Pub. date: |
30 June, 2000 |
| Edition: |
2002 ed. |
| Pages: |
210 |
| Description: |
Addresses electrothermal problems in modern VLSI systems. This book discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). |
| Synopsis: |
This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis. |
| Illustrations: |
36 Illustrations, black and white; XXIII, 210 p. 36 illus. |
| Publication: |
Netherlands |
| Imprint: |
Springer |
| Returns: |
Returnable |
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