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Item Details
Title: RELIABILITY, ROBUSTNESS AND FAILURE MECHANISMS OF LED DEVICES
METHODOLOGY AND EVALUATION
By: Yannick Deshayes, Laurent Bechou
Format: Hardback

List price: £76.00
Our price: £68.40
Discount:
10% off
You save: £7.60
ISBN 10: 1785481525
ISBN 13: 9781785481529
Availability: This item will be printed on demand and will usually be dispatched within 10 days.
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Stock: Currently 0 available
Publisher: ISTE PRESS LTD - ELSEVIER INC
Pub. date: 23 September, 2016
Pages: 172
Synopsis: The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.
Publication: UK
Imprint: ISTE Press Ltd - Elsevier Inc
Returns: Returnable
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