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Item Details
| Title:
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ADVANCED LASER DIODE RELIABILITY
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| By: |
Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda |
| Format: |
Hardback |
| List price:
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£86.95 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
1785481541 |
| ISBN 13: |
9781785481543 |
| Publisher: |
ISTE PRESS LTD - ELSEVIER INC |
| Pub. date: |
15 September, 2017 |
| Pages: |
200 |
| Synopsis: |
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. The book reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections support this kernel: a) failure analysis techniques, procedures and examples; and, b) device-oriented laser modeling and parameter extraction. |
| Publication: |
UK |
| Imprint: |
ISTE Press Ltd - Elsevier Inc |
| Returns: |
Returnable |
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