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Item Details
| Title:
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SEM MICROCHARACTERIZATION OF SEMICONDUCTORS
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| Volume: |
Volume 12 |
| By: |
D. B. Holt (Editor), D. C. Joy (Editor) |
| Format: |
Hardback |
| List price:
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£43.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
0123538556 |
| ISBN 13: |
9780123538550 |
| Publisher: |
ELSEVIER SCIENCE PUBLISHING CO INC |
| Pub. date: |
11 February, 1989 |
| Series: |
Techniques of Physics |
| Pages: |
452 |
| Synopsis: |
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope. |
| Publication: |
US |
| Imprint: |
Academic Press Inc |
| Returns: |
Non-returnable |
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