| Title:
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SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
THIRD EDITION |
| By: |
Joseph I. Goldstein, Dale E. Newbury, D. C. Joy |
| Format: |
Mixed media product |
| List price:
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£99.99 |
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£87.49 |
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£12.50 |
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| ISBN 10: |
0306472929 |
| ISBN 13: |
9780306472923 |
| Availability: |
Usually dispatched within 1-3 weeks.
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| Stock: |
Currently 0 available |
| Publisher: |
SPRINGER SCIENCE+BUSINESS MEDIA |
| Pub. date: |
30 April, 2007 |
| Edition: |
3rd Corrected ed. 2003. Corr. 2nd printing 2007 |
| Pages: |
689 |
| Description: |
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. |
| Synopsis: |
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. |
| Illustrations: |
XIX, 689 p. With online files/update. |
| Publication: |
US |
| Imprint: |
Kluwer Academic/Plenum Publishers |
| Returns: |
Returnable |