| Title:
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ASIAN TEST SYMPOSIUM PROCEEDINGS
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| Volume: |
3rd |
| By: |
Institute of Electrical and Electronics Engineers |
| Format: |
Paperback |
| List price:
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£72.50 |
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| ISBN 10: |
0818666900 |
| ISBN 13: |
9780818666902 |
| Publisher: |
IEEE COMPUTER SOCIETY PRESS,U.S. |
| Pub. date: |
31 October, 1996 |
| Pages: |
206 |
| Description: |
The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for te |
| Synopsis: |
The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for te |
| Publication: |
US |
| Imprint: |
IEEE Computer Society Press,U.S. |
| Returns: |
Non-returnable |